Bandpass NGD Time-Domain Experimental Test of Double-li Microstrip Circuit
نویسندگان
چکیده
In this article, a time-domain test on the negative group delay behavior of double-Li-structure microstrip circuit is proposed. The feasibility validated experimentally using Gaussian envelopes modulating sine carrier frequencies inside and outside frequency bands.
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ژورنال
عنوان ژورنال: IEEE design & test
سال: 2021
ISSN: ['2168-2364', '2168-2356']
DOI: https://doi.org/10.1109/mdat.2021.3103457